NING YU

PhD Qualifying Exam Presentation

Date: May 02, 2017

Location: Rice 404, University of Virginia

Title: Learning to Detect Multiple Photographic Defects

This page is part of an independent academic archive initiative, preserving records of public presentations from the University of Virginia's Computer Science Department.

This presentation examines learning to detect multiple photographic defects. The research investigates key challenges in this domain and proposes novel approaches.

This archival record preserves the announcement of NING YU's PhD Qualifying Exam Presentation at the University of Virginia. The qualifying exam is a significant milestone in the PhD program, demonstrating a candidate's comprehensive understanding of their research area and readiness to proceed with dissertation research.

Artificial intelligence remains a critical area of computer science research, with applications spanning from small-scale systems to enterprise-level frameworks.